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LISST Instruments >
LISST-25X - an advanced turbidity sensor
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LISST-25X
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| | LISST-25X marks a generational
advance in the measurement of suspended sediments. Unlike all prior
sediment or turbidity sensors, optical or acoustic, the LISST-25X maintains its
calibration over a 200:1 range of particle sizes. This is the only
sensor capable of holding calibration for sediment concentration
regardless of particle color or size within this broad a range. Depending on grain size, the LISST-25X is suitable for operations in an approximate concentration range of 1 to 2000 mg/l.
Essentially, the LISST-25X offers capabilities between those of an OBS, which suffers calibration changes due to changes in grain size or color and the LISST-100X, which provides the detailed size distribution. In short: The LISST-25X overcomes the OBS’s shortcomings, but does not provide the full size distribution of the LISST-100X.
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| | An anti-fouling accessory BioBlock is available for this instrument (see LISST accessories page).
The picture on the left shows the LISST25X with the BioBlock installed.
BioBlock is very strongly recommended for deployments in biologically productive waters. | | | | |
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| | The instrument is self-contained, with memory and batteries. It is
fully programmable to set sample rate. Data can be internally stored or
captured in real time. A depth sensor is included as standard. Windows software for data offload and display is provided. | | | | | | |  | | The idea behind the LISST-25X is to
use shaped focal plane detectors. These detectors (see figure) derive
their shape from the physics of light scattering. The shape is found
such that for any size of particle in the 2.5 to 500 micron range, the
instrument reports the correct volume concentration. A different shape
is found to yield area concentration.The ratio of volume to area is
called the Sauter Mean Diameter. The instrument employs 2 pairs of
shaped detectors. One pair measures particles in the 2.5 to 63 micron
range, the other in the 63-500 micron range.
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Related Links
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| | | | | | | | Updated 1/20/2010.
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JFIC2010
Las Vegas, NV, 27-29 June 2010, booth 207
9th annual StormCon
San Antonio, TX, 2-4 August 2010, booth 421
Ocean Optics XX
Anchorage, AK, 25 September - 1 October 2010
CASQA
CA, 1-3 November
PiE 2010
Villefranche-sur-Mer, France, 15-17 November
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