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Schlieren & LISSTs

July 7, 2008

The influence of schlieren on in situ optical measurements used for particle characterization [Sequoia, July 7, 2008] Mikkelsen OA, Milligan TG, Hill PS, Chant RJ, Jago CF, Jones SE, Krivtsov V, Mitchelson-Jacob G (2008): The influence...

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Calibrating the LISST series instruments

April 18, 2008

Calibrating the LISST series instruments [Sequoia, April18, 2008; this article is identical to Application Note L009] The LISST series of instruments measure particle size distribution, i.e. the volume fraction contained in each of...

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